Digital meets Culture
Export date: Wed Jun 19 13:43:30 2024 / +0000 GMT

Personalized Access to Cultural Heritage (PATCH 2015) @ IUI Conference


Personalized Access to Cultural Heritage (PATCH 2015)  @ IUI Conference

call for papers deadline January 16th 2015

8th International Workshop on Personalized Access to Cultural Heritage (PATCH 2015) is co-located with the ACM Intelligent User Interfaces 2015 Conference in Atlanta, GA, USA, 29 March – 1 April 2015. The primary goal of this workshop is to bring together researchers & practitioners who are working on various aspects of cultural heritage and are interested in exploring the potential of state of the art technology (onsite as well as online) to enhance the CH visit experience. The expected result of the workshop is a multidisciplinary research agenda that will inform future research directions and hopefully, forge some research collaborations.

PATCH workshop series are the meeting point between state of the art cultural heritage research and personalization using technology to enhance the personal experience in cultural heritage sites. We aim at building a research agenda for personalization in CH in order to make the individual CH experience a link in a chain of a lifelong CH experience which builds on past experience, is linked to daily life and provides the foundation for future experiences. The workshop aims to be multi-disciplinary. It is intended for researchers, practitioners, and students of information and communication technologies (ICT), cultural heritage domains (museums, archives, libraries, and more), and personalization.


Deadline for submissions is 16 January, 2015.

Paper submissions should follow the general <> ACM SigCHI format (i.e. the same as the IUI paper format)  <> submission guidelines and must comply with the formatting instructions:
§  Full papers: max. 10 pages
§  Position papers: max. 4 pages
§  Short papers: max. 4 pages
§  Demo papers: max. 4 pages

All papers should be submitted in PDF format via the <> online submission
system. An international panel of experts will review all submissions.

Demos need to provide links to the systems presented. Work that has already
been published should not be submitted unless it introduces a significant
addition to the previously published work.

For more information:

Follow us on twitter: @PATCH_workshop

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